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Nano-CMOS Design for Manufacturability - Robust Circuit and Physical Design for Sub-65 nm Technology Nodes

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By: Wong, Ban; Zach, Franz; Moroz, Victor; Mittal, Anurag; Starr, Greg; Kahng, Andrew © 2009 John Wiley & Sons

 

Description: This book provides a bridge that allows engineers to go from physical and circuit design to fabrication processing and, in short, make designs that are not only functional, but that also meet power and performance goals within the design schedule.
Sections
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Expand this node Front Matter
Preface
Table of Contents
Expand this node 1. Introduction
Part I. Newly Exacerbated Effects
Expand this node 2. Lithography-Related Aspects of DFM
Expand this node 3. Interaction of Layout with Transistor Performance and Stress Engineering Techniques
Part II. Design Solutions
Expand this node 4. Signal and Power Integrity
Expand this node 5. Analog and Mixed-Signal Circuit Design for Yield and Manufacturability
Expand this node 6. Design for Variability, Performance, and Yield
Part III. The Road to DFM
Expand this node 7. Nano-CMOS Design Tools: Beyond Model-Based Analysis and Correction
Expand this node Index